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Full article: Impact of heavy-ion irradiation on gate oxide reliability of silicon carbide power MOSFET
Radiation-induced shift of the flat-band voltage for MOS capacitors due... | Download Scientific Diagram
Space Radiation Effects on Electronics - Single Event Effects | Space Talos LTD
An Introduction to Radiation Effects on Electronics
Radiation Response of Silicon Carbide Diodes and Transistors | IntechOpen
Research Theme3 - Semiconductor Radiation Effects Research - 量子科学技術研究開発機構
Electronics | Free Full-Text | Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies
Memory cell write unit transient response simulated in the range of... | Download Scientific Diagram
The Impact of Space Radiation Environment on Satellites Operation in Near-Earth Space | IntechOpen
Frontiers | Failure quantitative assessment approach to MOSFET power device by detecting parasitic parameters
An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools - ScienceDirect
Radiation Effects on MOS Power Transistors | Semantic Scholar
Radiation Hardening of Electronic Components
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Effect of ionizing radiation on the behavior of the p-MOSFET when... | Download Scientific Diagram
Sensors | Free Full-Text | Investigation of Radiation Effects on FD-SOI Hall Sensors by TCAD Simulations
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Schematic representation of basic radiation effects in gate oxide of... | Download Scientific Diagram
Electronics | Free Full-Text | A Brief Review of Heavy-Ion Radiation Degradation and Failure of Silicon UMOS Power Transistors
A Quick Overview of Radiation Effects - Single Event Effects - Planet Analog
Total ionizing dose radiation effects on NMOS parasitic transistors in advanced bulk CMOS technology devices
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Radiation resistance testing of MOSFET and CMOS as a means of risk management
An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools - ScienceDirect
Single-event-transient effects in Junctionless Double-Gate MOSFETs with Dual-Material Gate investigated by 3D simulation - ScienceDirect
Applied Sciences | Free Full-Text | An Improved Investigation into the Effects of the Temperature-Dependent Parasitic Elements on the Losses of SiC MOSFETs